qelectrotech-source-mirror/docs/smart-device-bom.md

Smart Device Information and BOM CSV

Architecture

• A .qet project is XML. Placed component properties are held in ElementData::m_informations, a DiagramContext, and are serialized by the existing Element::fromXml() and Element::toXml() path.
• DeviceInformation is a typed view over that existing context. It does not introduce a second data store. Updates made by the properties editor continue to use ChangeElementInformationCommand, including undo/redo and dirty state.
• The project database copies element contexts into element_info and exposes reporting fields through element_nomenclature_view.
• GUI and CLI BOM exports both use BomExport::defaultQuery() against that view. The existing BOMExportDialog remains the only GUI export entry point; users can still customize columns, filters, and grouped/ungrouped output.

Device Properties

Device field	XML/context key	Default BOM
Device tag	label	Yes
Manufacturer	manufacturer	Yes
Part number	manufacturer_reference	Yes
Model	model	Yes
Description	description	Yes
Category	category	Yes
Quantity	quantity	Yes
Voltage rating	voltage_rating	Yes
Current rating	current_rating	Yes
Page	folio from the diagram	Yes
Notes	notes	Yes

The five new context keys are model, category, voltage_rating, current_rating, and notes. They are available in the existing information editor for Simple and Master elements, in symbol definitions, in the SQL nomenclature view, and in the export column picker.

No XML version bump or migration is required. Missing keys read as empty strings, empty properties are omitted by the existing writer, and unknown context keys remain preserved. Quantity and ratings stay free text so existing unit conventions and decimal quantities are not changed implicitly.

BOM Policy

The default BOM query exports one row per Simple or Master element. Slave contacts, terminal-strip elements, reports, thumbnails, and conductor definitions are excluded. A Master device is counted once and PLC I/O entries are not expanded. The existing exclude_from_bom property is honored by the SQL view, including common true representations (true, 1, yes, on).

The default columns are:

Device tag, Designation, Manufacturer, Part number, Model, Description, Category, Quantity, Voltage rating, Current rating, Page, Notes.

The existing Format as bill of materials checkbox provides grouped output; it is off by default so the initial export remains ungrouped. Users may change the query and column order through the existing dialog. The command-line --export-bom operation uses the same default query and column order.

CSV output is UTF-8 with a BOM, semicolon-delimited, and quotes every field. Embedded quotes are doubled and embedded newlines are retained. QSaveFile provides atomic replacement; query, open, write, and commit failures are reported without deleting an existing destination first.

Verification

The smart-device test is registered explicitly in tests/qttest/CMakeLists.txt and uses only Qt Test and Qt SQL. It is therefore part of the normal cross-platform CMake/CTest flow:

cmake -S . -B build -DPACKAGE_TESTS=ON
cmake --build build
ctest --test-dir build --output-on-failure

tst_smart_device checks the metadata column contract, Simple/Master filtering, stable page ordering, UTF-8 with Latin and non-Latin samples, CSV escaping, and atomic write success/failure. Existing project XML save/load tests cover the generic DiagramContext persistence path used by the new keys.

Manual checks:

1. Open an existing project and edit a Simple or Master element's information.
2. Set all device fields, apply, undo, redo, save, close, and reopen.
3. Open Project > Export as CSV and verify the device columns are preselected.
4. Export with grouping both disabled and enabled.
5. Verify leading-zero part numbers, non-Latin text, quotes, and newlines in a UTF-8 CSV reader.

Cable management, terminal-strip planning, automatic wire numbering, PLC I/O expansion, panel layout, and manufacturer catalog integration are out of scope.