mirror of
https://github.com/qelectrotech/qelectrotech-source-mirror.git
synced 2026-09-25 03:04:13 +02:00
enesgursoy6110
94 lines
4.1 KiB
Markdown
94 lines
4.1 KiB
Markdown
# Smart Device Information and BOM CSV
|
|
|
|
## Architecture
|
|
|
|
- A `.qet` project is XML. Placed component properties are held in
|
|
`ElementData::m_informations`, a `DiagramContext`, and are serialized by the
|
|
existing `Element::fromXml()` and `Element::toXml()` path.
|
|
- `DeviceInformation` is a typed view over that existing context. It does not
|
|
introduce a second data store. Updates made by the properties editor continue
|
|
to use `ChangeElementInformationCommand`, including undo/redo and dirty state.
|
|
- The project database copies element contexts into `element_info` and exposes
|
|
reporting fields through `element_nomenclature_view`.
|
|
- GUI and CLI BOM exports both use `BomExport::defaultQuery()` against that
|
|
view. The existing `BOMExportDialog` remains the only GUI export entry point;
|
|
users can still customize columns, filters, and grouped/ungrouped output.
|
|
|
|
## Device Properties
|
|
|
|
| Device field | XML/context key | Default BOM |
|
|
| --- | --- | --- |
|
|
| Device tag | `label` | Yes |
|
|
| Manufacturer | `manufacturer` | Yes |
|
|
| Part number | `manufacturer_reference` | Yes |
|
|
| Model | `model` | Yes |
|
|
| Description | `description` | Yes |
|
|
| Category | `category` | Yes |
|
|
| Quantity | `quantity` | Yes |
|
|
| Voltage rating | `voltage_rating` | Yes |
|
|
| Current rating | `current_rating` | Yes |
|
|
| Page | `folio` from the diagram | Yes |
|
|
| Notes | `notes` | Yes |
|
|
|
|
The five new context keys are `model`, `category`, `voltage_rating`,
|
|
`current_rating`, and `notes`. They are available in the existing information
|
|
editor for Simple and Master elements, in symbol definitions, in the SQL
|
|
nomenclature view, and in the export column picker.
|
|
|
|
No XML version bump or migration is required. Missing keys read as empty
|
|
strings, empty properties are omitted by the existing writer, and unknown
|
|
context keys remain preserved. Quantity and ratings stay free text so existing
|
|
unit conventions and decimal quantities are not changed implicitly.
|
|
|
|
## BOM Policy
|
|
|
|
The default BOM query exports one row per Simple or Master element. Slave
|
|
contacts, terminal-strip elements, reports, thumbnails, and conductor
|
|
definitions are excluded. A Master device is counted once and PLC I/O entries
|
|
are not expanded. The existing `exclude_from_bom` property is honored by the
|
|
SQL view, including common true representations (`true`, `1`, `yes`, `on`).
|
|
|
|
The default columns are:
|
|
|
|
`Device tag, Designation, Manufacturer, Part number, Model, Description,
|
|
Category, Quantity, Voltage rating, Current rating, Page, Notes`.
|
|
|
|
The existing **Format as bill of materials** checkbox provides grouped output;
|
|
it is off by default so the initial export remains ungrouped. Users may change
|
|
the query and column order through the existing dialog. The command-line
|
|
`--export-bom` operation uses the same default query and column order.
|
|
|
|
CSV output is UTF-8 with a BOM, semicolon-delimited, and quotes every field.
|
|
Embedded quotes are doubled and embedded newlines are retained. `QSaveFile`
|
|
provides atomic replacement; query, open, write, and commit failures are
|
|
reported without deleting an existing destination first.
|
|
|
|
## Verification
|
|
|
|
The smart-device test is registered explicitly in
|
|
`tests/qttest/CMakeLists.txt` and uses only Qt Test and Qt SQL. It is therefore
|
|
part of the normal cross-platform CMake/CTest flow:
|
|
|
|
```sh
|
|
cmake -S . -B build -DPACKAGE_TESTS=ON
|
|
cmake --build build
|
|
ctest --test-dir build --output-on-failure
|
|
```
|
|
|
|
`tst_smart_device` checks the metadata column contract, Simple/Master filtering,
|
|
stable page ordering, UTF-8 with Latin and non-Latin samples, CSV escaping, and
|
|
atomic write success/failure. Existing project XML save/load tests cover the
|
|
generic `DiagramContext` persistence path used by the new keys.
|
|
|
|
Manual checks:
|
|
|
|
1. Open an existing project and edit a Simple or Master element's information.
|
|
2. Set all device fields, apply, undo, redo, save, close, and reopen.
|
|
3. Open Project > Export as CSV and verify the device columns are preselected.
|
|
4. Export with grouping both disabled and enabled.
|
|
5. Verify leading-zero part numbers, non-Latin text, quotes, and newlines in a
|
|
UTF-8 CSV reader.
|
|
|
|
Cable management, terminal-strip planning, automatic wire numbering, PLC I/O
|
|
expansion, panel layout, and manufacturer catalog integration are out of scope.
|